Procedure |
Estimated Accuracy |
Notes |
Calibration (flatfielding, bias subtraction, dark correction) |
Bias subtraction |
0.1 DN rms |
Unless bias jump is present |
Dark subtraction |
0.1 DN/hr rms |
Error larger for warm pixels; absolute error uncertain because of dark glow |
Flatfielding |
<1% rms large scale |
Visible, near UV |
0.3% rms small scale |
~10% |
F160BW; however, significant noise reduction achieved with use of correction flats |
Relative photometry |
Residuals in CTE correction |
< 3% for the majority (~90%) of cases |
|
up to 10% for extreme cases (e.g., very low backgrounds) |
|
Long vs. short anomaly (uncorrected) |
< 5% |
Magnitude errors <1% for well-exposed stars but may be larger for fainter stars. Some studies have failed to confirm the effect |
|
|
Aperture correction |
4% rms focus dependence (1 pixel aperture) |
Can (should) be determined from data |
<1% focus dependence (> 5 pixel) |
1-2% field dependence (1 pixel aperture) |
Contamination correction |
3% rms max (28 days after decon) (F160BW) |
|
1% rms max (28 days after decon) (filters bluer than F555W) |
|
Background determination |
0.1 DN/pixel (background > 10 DN/pixel) |
May be difficult to exceed, regardless of image S/N |
Pixel centering |
< 1% |
|
Absolute photometry |
Sensitivity |
< 2% rms for standard photometric filters |
Red leaks are uncertain by ~10% |
2% rms for broad and intermediate filters in visible |
< 5% rms for narrow-band filters in visible |
2-8% rms for UV filters |
Astrometry |
Relative |
0.005" rms (after geometric and 34th-row corrections) |
Same chip |
0.1" (estimated) |
Across chips |
Absolute |
1" rms (estimated) |
|