In Table 16.1 through Table 16.5, the accuracies are listed for each of STIS's basic observation modes: CCD spectroscopy, MAMA spectroscopy, CCD imaging, MAMA imaging, and target acquisition. The pixels in these tables are low-resolution pixels. All accuracies quoted are 2 limits. The accuracies reflect our current understanding of STIS as of March 2001 and are those we expect the pipeline calibration or recalibration of archive data to achieve during Cycle 11.
We maintain on the STIS web pages (under "Calibration
") both a table of our ultimate expected accuracies and a table of the accuracies delivered by pipeline data at any one time. The latter is frequently updated as we continue to work through the on-orbit calibration of STIS providing updated calibration reference files to the pipeline and the archive for STIS's many modes and capabilities. (See also the STIS section of the HST Data Handbook
.)
The wavelength solution supplied by our calibration software to date does not correct for the effects of the monthly offsets on the MAMA echelle dispersion solution. Shifts between expected and observed locations of features in long exposure engineering wavecals of several pixels have been observed. As these shifts may be different in sign, dependent on the direction of the offset, the resulting differences between features in data taken at different epochs may reach values (in an extreme case) of ~5 pixels. Typically, however, the error will be closer to that shown in Table 16.2. We are currently in the process of implementing an improved treatment for the effects of the monthly offsets that will reduce the error to the nominal listed in this table. Further information will be posted on the web when available.
We remind you that calibration data are immediately non-proprietary and should you have need for extreme accuracy or urgent results, you may wish to consider direct analysis of the calibration data for your particular observing mode (see also Chapter 17 for a description of our on-orbit calibration program).
Attribute |
Accuracy1 |
Limiting Factors |
---|---|---|
Relative wavelengths-within an exposure |
0.1-0.3 pixel |
|
Absolute wavelengths-across exposures |
0.2-0.5 pixel |
|
5% 5% |
Instrument stability, evolution of charge transfer efficiency, and photometric calibration |
|
2% 2% |
Instrument stability, evolution of charge transfer efficiency, and photometric calibration |
1 All accuracies refer to prime wavelength settings and directly calibrated special secondary settings. Intermediate settings have roughly a factor of two less accuracy. 2 Assumes star is well-centered in slit. See the HST Data Handbook for a more complete description of the impact of centering on accuracies. 3 Assumes use of a 2" wide photometric slit. See the HST Data Handbook for a fuller description of the impact of slit width on photometric accuracy. 4 Photometric accuracies referenced are for continuum sources; equivalent width and line profile measures are subject to other uncertainties (such as spectral purity and background subtraction). |
Attribute |
Accuracy1 |
Limiting Factors |
---|---|---|
Relative wavelengths-within an exposure |
0.25-0.5 pixel |
|
Absolute wavelengths 1 |
0.5-1.0 pixel |
|
4% 5% 8% |
Instrument stability and photometric calibration |
|
2% 2% 5% |
Instrument stability and flat fields Ripple correction accuracy, scattered light subtraction |
1 All accuracies refer to prime wavelength settings and directly calibrated special secondary settings. Intermediate settings have roughly a factor of two less accuracy. 2 Assumes star is well-centered in slit. See the HST Data Handbook for a more complete description of the impact of centering on accuracies.3 Assumes use of a wide photometric slit. See the HST Data Handbook for a fuller description of the impact of slit width on photometric accuracy.4 For 0.2x0.2 arcsecond slit. These are typical accuracies which can be 2 to 3 times better or worse as a function of wavelength (see STIS ISR 98-18 for details). |
Attribute |
Accuracy |
Limiting Factors |
---|---|---|
Guide star acquisition |
1-2 arcseconds |
Catalog uncertainties |
Following target acquisition exposure Point sources Diffuse sources |
0.01 arcsecond 0.01-0.1 arcsecond |
Centering accuracy plus plate scale accuracy to convert pixels to arcseconds See Chapter 8 |
Following peakup acquisition exposure |
5% of the slit width |
Number of steps in scan and PSF |
We intend to update all library flats to a signal-to-noise of at least 100:1 per pixel.1 The CCD flats have temporal variation of < 1% per year. The MAMA flats have shown some evidence for variation at the 1-2% per resolution element level over roughly year timescales. Due to the limited calibration-lamp lifetimes, we expect to take MAMA flats once per year per detector. As our knowledge grows, we will provide updates on the web pages.
1 A "pixel" for the MAMA refers to 1024 x 1024 native format pixels.
Space Telescope Science Institute http://www.stsci.edu Voice: (410) 338-1082 help@stsci.edu |