A pattern refers to a series of exposures of a single target taken at slightly different telescope pointings, with the same set of guide stars. For STIS, patterns are commonly used to:
Predefined patterns were available in Cycles 7 and 8 for STIS, as the RPS2 Optional Parameter pattern
, and for WFPC2, as the Optional Parameter dither-type
. For consistency and ease of use, all predefined patterns can now be selected and modified using the new Patterns category of the Proposal Editor in RPS2. One selects and enumerates patterns from a list of generic and instrument-specific patterns in the Patterns editor, then uses the Exposure Editor to apply a numbered pattern to an exposure as a Special Requirement. One can also combine patterns, as described below. The patterns for Cycle 9 and 10 are based on those in Cycle 8, with some modifications of the default parameters to make them specific to an instrument and a default purpose. All patterns are fully described and illustrated in the Cycle 10 Phase II Proposal Instructions. Additional examples and advice are given in the Dither Handbook at:
http://www.stsci.edu/instruments/wfpc2/Wfpc2_driz/dither_handbook.html.
STIS-SPIRAL-DITH
can be used to make a mosaic of images. It performs a spiral dither pattern, starting at the center and moving outward counterclockwise.
STIS-CCD-BOX
and STIS-MAMA-BOX
are parallelograms based on the BOX patterns used with WFPC2 and STIS in Cycle 8 to dither images. The default parameters for these two patterns give offsets in integer numbers of pixels along the X-axis and Y-axis, which can be used, for example, to dither hot pixels. By dividing the default point spacing by 2, one can achieve half-pixel shifts in each coordinate to improve spatial sampling.
STIS-ALONG-SLIT
, which steps the target along the slit, can be used to dither hot pixels (integer pixel steps) or to improve spatial sampling (fractional pixel steps) in spectroscopic images. (See Figure 11.7.)
STIS-PERP-TO-SLIT
can be used to step the slit across an extended source to map the spectral characteristics of the source. (See Figure 11.8.) It can also be used to subsample the line-spread function by moving a target by fractions of a pixel.
Generic patterns, available for all instruments, have been added for flexibility in pattern design. The generic LINE
pattern allows for movement along a line at an arbitrary angle. The generic SPIRAL
pattern is essentially the same as the STIS-SPIRAL-DITH
.
A new feature that was introduced in the Cycle 9 RPS2 is the ability to combine two patterns. After selecting a pattern and defining the parameters, you can choose to add a secondary pattern. In this case, the secondary pattern is executed at each point in the primary pattern. It can either be centered on the primary points, or can use the primary points as its initial points. For example, instead of just stepping a slit across an extended target at five points with STIS-PERP-TO-SLIT
, you can add STIS-ALONG-SLIT
with two points to make a 5 by 2 grid of observations. If Center Pattern = yes
for both patterns, the grid will be centered on the target position. To check that you have specified a pattern correctly, you can display it using the FOV Tool in the Description Generator.
STIS-ALONG-SLIT
, with Number_of_Points = 5
and Point_Spacing = 0.15
(arcsec).STIS-PERP-to-SLIT
, with Number_of_Points = 5
and Point_Spacing
= 0.2 (arcsec). There is no single observing strategy that is entirely satisfactory in all circumstances for STIS. One must consider cosmic rays, hot pixels (pixels with high, time-variable dark current), and spatial undersampling of the image. One strategy that can be used to minimize the effects of undersampling and to reduce the effects of hot pixels is to dither, that is, to offset the telescope between exposures by either integer or subpixel steps. The best choice for the number and size of the dithers depends on the amount of time available and the goals of the project. In the following we will address a few issues related to dithering:
G140L
, G230LB
, G230MB
, G430L
, and G750L
), the resulting undulation pattern is broad and irregular. On the other hand, if the spectrum has an appreciable tilt across the detector (as for gratings G140M
, G230M
, G230L
, G430M
, and G750M
; see e.g., STIS Instrument Science Report 98-19
), the undulation is quasi-periodic. Two representative cases are shown in Figure 11.9, which displays the flux in the peak row in the rectified image normalized by the total flux for stellar observations taken with G430L
and G750M
. Note that this effect is inconsequential in most cases: if the source is unresolved, several rows of the spectrum will be extracted to make a single spectrum, eliminating the effect; if the source is sufficiently extended to be well sampled, the undulations will not occur. A problematic situation is encountered when row-by-row spectral analyses are needed of an extended component which is affected by the undulations produced by a compact component (e.g., near the center of a galaxy containing an active nucleus). For example, kinematic measurements of spatially extended emission or absorption lines can be affected in cases where a compact continuum component produces a baseline that fluctuates rapidly across the spectral lines of interest. The remedy is to perform spatial dithering by a non-integer number of pixels along the slit, (e.g., N+0.5 pixels; see below under "Dithering Spectroscopic Observations"), then combine the dithered images before rectification.
CR-SPLIT
images at each of three different dither positions. The reason is that in addition to hot pixels, low or cold pixels can be present and simple strategies selecting the minimum of two pixel values can fail. However, even four images (two each at two dither positions) will greatly aid in eliminating hot-pixel artifacts.
CR-SPLIT
) at each position in the dithered sequence, especially for spectroscopy mode observations (see also Cosmic Rays).
The simplest way to schedule dithers with STIS in RPS2 is to use the patterns STIS-CCD-BOX
or STIS-MAMA-BOX
(four-point parallelogram dithers, centering on fractional pixels to gain spatial resolution) or, for spectroscopic observations that use a long slit, the pattern STIS-ALONG-SLIT
(for linear dithers in the AXIS2
direction, with user-specified offsets). An alternate approach is to use POS TARG
.
Note that large dithers will incur small errors due to the camera geometric distortion which increases toward the CCD corners and alters the image scale by about 1% at the corners. For instance, a 20 pixel offset at the field center will suffer a 0.2 pixel error at the CCD corners. Large dithers may also occasionally require a different set of guide stars for each pointing, thus greatly reducing the expected pointing accuracy (accuracy of only ~1 arcsec due to limits to the accuracy of the Guide Star Catalogue).
For related articles on dither strategies, see the following papers (all available through the STScI web pages): "A Package for the Reduction of Dithered Undersampled Images
," by Fruchter et al., in the 1997 HST Calibration Workshop Proceedings, and WFPC2 Instrument Science Report 98-04
, and "A Method for the Linear Reconstruction of Undersampled Images
", by A. S. Fruchter et al. (astro-ph/9808087), and the Dither Handbook of Koekemoer et al., which can be found at:
http://www.stsci.edu/instruments/wfpc2/Wfpc2_driz/dither_handbook.html.
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