Phase II-Scheduling Approved Observations

Below, we provide a checklist for observers filling out Phase II proposals. You should do the following prior to submitting your program.

For All Proposals:

• Update the text in the Phase II template ("Observing Description" and "Special Requirements"-they were copied from your Phase I proposal and may need modification based on TAC comments and definition of the observation details).
• Specify your coordinates (especially for spectroscopic observations) in the "Guide Star Reference" frame. Don't forget to include the PLATE-ID in your RPS2 file. Specify proper motions if applicable.
• Specify accurate V magnitude, fluxes, spectral type, and colors for your target. This is required for MAMA spectroscopic targets to allow for bright-object screening.
• Properly specify your exposures.
• Include target acquisitions and peakups as needed.
• Specify orientation requirements, and/or timing requirements. To facilitate scheduling, please provide the broadest possible ranges for your requirements. If multiple ORIENTs are possible, please include the alternatives.
• Specify any allocated coordinated parallel exposures.
• Include any additional wavecal exposures if needed.
• Verify the correct usage (i.e., direction) of your PATTERN optional requirement or POS TARGs (if used).
• For slitless spectroscopy or prism observations, remember to take an image and the proper calibration sequence.

For CCD Observations:

• CR-SPLIT CCD exposures, as appropriate. Keep individual exposure times < 1000 s if possible to avoid excessive cosmic ray events.
• Add fringe-flat exposures for G750L and G750M observations at  > 7500 Å.
• Consider the use of dithering for imaging observations, or stepping along the slit for spectroscopic observations.

For MAMA Observations:

• Re-verify that your target falls below the bright-object limits.
• For TIME-TAG observations, verify the value for BUFFER-TIME.
• Consider the use of dithering for imaging observations.
• Consider the use of stepping along the slit for first-order modes or the use of FP-SPLIT slits for echelle modes, when high signal-to-noise is required.